These Product Tours are just a structured sequence of web pages. Click the ► button to step through them.
The navigation buttons have the following functions:
|◄ takes you back to the beginning of the current tour
◄ is the same as your browser back button
▲ takes you up a level in the hierarchy
► steps forward to the next page
The drop-lists give another way of accessing the same pages
shows and hides a map of the structure of the tour with links to each page.
expands the tour into its own window (only visible when embedded in another page.)
SMU4000 Series Tour Map
SMU4000 measurement speed
Built for Speed
Measurement period user settable down to 200µs
Minimum pulse width 200µs
Variable slew rates up to 12V/ms (SMU4001) or 1.2V/µs (SMU4201)
Voltage Source settling time as low as 300µs
Current Source settling time as low as 200µs
Measure to memory at 5k/s sustained
Remote command reaction time typically <5ms
Auto Delay
The SMU4000 can implement an automated measurement delay to
wait only as long as is necessary for the measurement to settle before recording a measurement.
In most applications this will be the fastest way to measure.
Measurement Period
The measurement period defines the amount of time that each measurement is averaged for and is
a trade-off between measurement accuracy and measurement speed. In the absence of noise, an accurate
measurement of a stable system can be made in as little as 200µs.
Triggering
Measurements that depend on external processes can be triggered by remote commands or the Digital IO port and can
report pass/fail results back extremely fast for fully automated tests.